Work groups of the DGE 



Scanning Probe Microscopy (SPM)

Energy filtering and Electron Energy-Loss Spectroscopy (EF & EELS)

Preparation and Imaging of Virgin Organic Systems (PANOS)

Electron Microscopic Diagnostics of Causative Organisms (EMED)

High Resolution Transmission Electron Microscopy (HREM)

Focused Ion Beam (FIB)


The DGE offers a broad support for the activities of the work groups. The possibilities are described in the current conditions for support. Furthermore, there exists the possibility to apply for additional support for special events.


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